Automated consistent results
Advanced Pattern Matching gives lots of options
Fully programmable options
Can be used for multiple devices or applications
Fits right into your workflow
Enhanced networking capabilities for easy use
Cost effective & budget friendly
Multiple dedicated tools for less than a single competitive tool
Want to Try?
Rent time on our demo system.
The easy way to see if the systems will work for you. We run samples under different conditions prepare a report and then discuss your result.
A few things we’re really good at…
Understanding your needs and creating or adapting test strategies along with your engineering staff.
There is always a solution or combinations to solve your issues
Wafer Map data can be used to complement or replace information with optical results
Everything moves in the wafer dicing process. Our capture and align ensures repeatable processing
Devices move around inside cavities or on gel pack. Single or multiple packs are easily processed
Modularity in our system means if something can be presented to the camera it can be analysed