DETECTION

Automated consistent results

Advanced Pattern Matching gives lots of options

Flexibility

Fully programmable options

Can be used for multiple devices or applications

Integration

Fits right into your workflow

Enhanced networking capabilities for easy use

Fast ROI

Cost effective & budget friendly

Multiple dedicated tools for less than a single competitive tool

Want to Try?
Rent time on our demo system.

The easy way to see if the systems will work for you. We run samples under different conditions prepare a report and then discuss your result.

A few things we’re really good at…

Understanding your needs and creating or adapting test strategies along with your engineering staff.

There is always  a solution or combinations to solve your issues

Wafer

Wafer Map data can be used to complement or replace information with optical results

Diced Wafer

Everything moves in the wafer dicing process. Our capture and align ensures repeatable processing

Waffle/GEL

Devices move around inside cavities or on gel pack. Single or multiple packs are easily processed

Custom

Modularity in our system means if something can be presented to the camera it can be analysed